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Announcements
Microscopy & Image Analysis
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Updated November 30, 2012
Microscopy & Image Analysis Laboratory Offering Workshop Demonstrations at NCRC
SUPER-Resolution STED confocal imaging is now available for a limited time at the MIL-North Facility at NCRC, Bldg 20, Rm 49S. Structured Emission Depletion, known as STED, pushes the limits of theoretical resolution beyond what was theoretically possible. We are able to offer this technology for a limited time to the U-M research community, at no charge. Leica Microsystems has kindly installed this on to our existing TCS SP8 2-photon system with FLIM and FCS for us to try. Some of our users have already had a session on it and have seen structures as small as 50 nm (not possible with conventional confocal imaging). This system is truly remarkable in that it has “gated” STED meaning that photons that arrive fast due to their fast lifetime decay can influence the image and mask the resolution. Leica has perfected a way to throw out any early arriving photons thus further improving the image resolution; thus the gating module. Combining super-resolution STED with fluorescence lifetime imaging (FLIM), correlation spectroscopy (FCS), and a pulsed white light laser makes this a one-of-a kind instrument that will surely put our research community far ahead of the competition. For a demonstration using your samples, you are encouraged to contact Chris Edwards (fishon@umich.edu), MIL Manager or Kristofer Fertig, (kristofer.Fertig@leica-microsystems.com) Leica sales and applications specialist.
The new TCS SP8 gSTED will be available through mid-January 2013.
For more information, download the event flyer or contact Chris Edwards, MIL Manager, at fishon@umich.edu or 734-763-1170.
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